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DRIVE-LEVEL CAPACITANCE PROFILING (DLCP) MEASUREMENT 

 

Drive-level capacitance profiling is an extremely useful technique to characterize amorphous silicon or other semiconductor material with large concentrations of deep band gap states.  

 

By measuring the doping profile of a material, it is possible to reveal deep defects in semiconductor junctions.

 

The implementation of DLCP by the CSM/Win software features simple menus and operation as well as straight forward analysis and data presentation.

 

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