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CSM/Win SYSTEM FAMILY

Backed by over three decades experience in C-V plotting instrumentation, Materials Development Corporation offers the most complete selection of C-V plotters available. The MDC product family has grown with advances in the semiconductor industry and this is why MDC has remained the leader in the C-V measurement field and will continue to set the pace in C-V plotter technology.

The CSM/Win family of C-V plotters includes single frequency and multi-frequency capacitance-conductance meters, and quasi-static capacitance meters. For each meter type there is a choice of accuracies and voltage ranges.

The MDC Semiconductor Measurement Systems are not limited to just capacitance and conductance measurements. Other options include current-voltage measurements, gate oxide integrity, advanced MOS charge analysis, interface trap density, dielectric constant, and Triangular Voltage Sweep analysis. If you have a special requirement, MDC can help as no one else can. We will design customized hardware and software to meet your needs.

C-V PLOTTERS

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COPPER DIFFUSION TEST SYSTEMS

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