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CSM/Win with the Keithley 4200 Semiconductor Characterization System

The MDC CSM/Win-4200 System integrates the extraordinary power of the CSM/Win software with the power of the new Keithley 4200-SCS.  Measure capacitance, voltage, and current down to sub-femtoamp levels.  

Integrating the wide ranging capacity of the 4200-SCS and the most advanced software available today creates one of the most versatile systems on the market.  Measure C-V, I-V, Quasistatic C-V.  Use up to 8 SMU's for parametric measurements, Solar Cells, or Gate Oxide Integrity measurements.

 


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