Materials Development Corporation was founded in
1970 by a group of faculty and graduate students from some of the most prestigious
universities in Southern California. MDC is responsible for a number of innovations in the
semiconductor measurement field:
- 1970: MDC developed and marketed one of the first commercially
available automatic doping profilers.
- 1974: MDC developed and marketed the first commercially
available Mercury Probe for non-destructive wafer measurements.
- 1977: MDC developed and marketed the first computerized C-V
plotter. MDC personnel developed many of the analysis algorithms now in use for
computerized MOS C-V measurements.
- 1985: MDC developed and sold the first dual, integrated hot
chuck system for high throughput mobile ionic contamination measurements.
- 1996: MDC developed the first autoloading hotchuck system to
increase throughput of mobile ionic contamination measurements.
- 1997: MDC released the CSM/Win System software, the first C-V
plotting software utilizing the Microsoft Windows operating system. This allows the
software to be much more versatile in data gathering and analysis. The Windows environment
makes for a more user friendly interface as well as offering greater choices in data
MDC developed the Model 441 Cryogenic Probe Station. Its unique design
allows for cryogenic measurements down to near liquid nitrogen temperatures
(77K) without needing a vacuum chamber.
MDC continues to improve both the hardware and
software for C-V measurements and analyses of semiconductor devices. Taking full advantage
of the latest C-V measuring instruments and more powerful computers, MDC offers the widest
variety of C-V and I-V measurement systems available.
MDC has sold over 1,500 C-V plotting instruments
worldwide. We are proud of our continuing development and education efforts. We are always
adding new and improved measurements to keep pace with the fast moving semiconductor