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About MDC

Materials Development Corporation was founded in 1970 by a group of faculty and graduate students from some of the most prestigious universities in Southern California. MDC is responsible for a number of innovations in the semiconductor measurement field:

  • 1970:  MDC developed and marketed one of the first commercially available automatic doping profilers.

 

  • 1974:  MDC developed and marketed the first commercially available Mercury Probe for non-destructive wafer measurements.

 

  • 1977:  MDC developed and marketed the first computerized C-V plotter. MDC personnel developed many of the analysis algorithms now in use for computerized MOS C-V measurements.

 

  • 1985:  MDC developed and sold the first dual, integrated hot chuck system for high throughput mobile ionic contamination measurements.

 

  • 1996:  MDC developed the first autoloading hotchuck system to increase throughput of mobile ionic contamination measurements.

 

  • 1997:  MDC released the CSM/Win System software, the first C-V plotting software utilizing the Microsoft Windows operating system. This allows the software to be much more versatile in data gathering and analysis. The Windows environment makes for a more user friendly interface as well as offering greater choices in data output.

MDC continues to improve both the hardware and software for C-V measurements and analyses of semiconductor devices. Taking full advantage of the latest C-V measuring instruments and more powerful computers, MDC offers the widest variety of C-V and I-V measurement systems available.

MDC has sold over 1,500 C-V plotting instruments worldwide. We are proud of our continuing development and education efforts. We are always adding new and improved measurements to keep pace with the fast moving semiconductor industry.

 


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