Materials Development Corporation was founded in
1970 by a group of faculty and graduate students from some of the most prestigious
universities in Southern California. MDC is responsible for a number of innovations in the
semiconductor measurement field:
- 1970: MDC developed and marketed one of the first commercially
available automatic doping profilers.
- 1974: MDC developed and marketed the first commercially
available Mercury Probe for non-destructive wafer measurements.
- 1977: MDC developed and marketed the first computerized C-V
plotter. MDC personnel developed many of the analysis algorithms now in use for
computerized MOS C-V measurements.
- 1985: MDC developed and sold the first dual, integrated hot
chuck system for high throughput mobile ionic contamination measurements.
- 1996: MDC developed the first autoloading hotchuck system to
increase throughput of mobile ionic contamination measurements.
- 1997: MDC released the CSM/Win System software, the first C-V
plotting software utilizing the Microsoft Windows operating system. This allows the
software to be much more versatile in data gathering and analysis. The Windows environment
makes for a more user friendly interface as well as offering greater choices in data
MDC continues to improve both the hardware and
software for C-V measurements and analyses of semiconductor devices. Taking full advantage
of the latest C-V measuring instruments and more powerful computers, MDC offers the widest
variety of C-V and I-V measurement systems available.
MDC has sold over 1,500 C-V plotting instruments
worldwide. We are proud of our continuing development and education efforts. We are always
adding new and improved measurements to keep pace with the fast moving semiconductor