HOME

ABOUT

NEW

PRODUCTS

SERVICES

REPS

CONTACT

LITERATURE

TECH TIPS

SITE MAP

CALCULATORS

 

 


QUASI-STATIC MEASUREMENTS

The Quasi-static measurement compares a high frequency capacitance-voltage plot to a C-V plot measured near zero Hertz (quasi-static).   By analyzing the difference in the depletion region of the curves, the interface trap density (Dit) can be determined in the sample under test.

  qs.gif (11209 bytes)


HOME    ABOUT    REPS    NEW     PRODUCTS     SERVICES    CONTACTS   

TECH TIPS    LITERATURE    WEB SITE MAP    CALCULATORS


Copyright 1999-2011 Materials Development Corporation   All rights reserved