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INTERFACE TRAP DENSITY ANALYSIS OPTION

 

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MDC offers interface trap density analysis using both the Conductance-Frequency and Quasi-static techniques. The Conductance-Frequency method is recommended for fine-tuning of processes where the highest resolution is needed. The Quasi-static technique is recommended where moderate to high levels of interface traps are monitored, such as in radiation damage studies. Requires quasi-static option or variable frequency option.

 


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